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A single device based Voltage Step Stress (VSS) Technique for fast reliability screening

机译:基于单个器件的电压阶跃应力(VSS)技术用于快速可靠性筛选

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摘要

A new wafer-level reliability qualification methodology is proposed. Unlike conventional method which usually takes days to completion, the total test time of the new technique can be shortened within 2 hours. Besides, it only requires a single device. This new technique is easy to implement on commercial equipment and it has been successfully validated on different processes including the most advanced 28nm process with both SiON and high-k gate stacks. This new technique can be an effective tool for fast reliability screening during process development in future.
机译:提出了一种新的晶圆级可靠性鉴定方法。与通常需要几天才能完成的传统方法不同,新技术的总测试时间可以缩短2小时。此外,它只需要一个设备。这项新技术很容易在商用设备上实施,并且已经在不同工艺上得到成功验证,包括采用SiON和高k栅堆叠的最先进的28nm工艺。这项新技术可以成为将来在流程开发过程中进行快速可靠性筛选的有效工具。

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